The electric functional control and in circuit test (ICT) complement the optical inspection with an AOI-system and complete our technical possibilities in quality assurance for THT and SMD models.
During functional control the input signals of an assembly are simulated and the output values are compared to the specifications. The parameters and measured values of every module are collected in a text file, put into archives and can be provided on request. Every module will be issued with a unique serial number, so that even after years the test results can be matched to the respective assembly. Field failures can be analyzed even after years and compared to the former test results. With this knowledge the test strategies can be continuously improved as well as test procedures and test equipment can be optimized. This process takes place generally in close collaboration with our customers, because by means of these possibilities improvement of the subsequent product versions can be realized.
Quality assurance for all THT and SMD types
Functional tests by themselves however are no guarantor for full functionality in individual applications, because especially in complex circuits not all features or the functionality of all single components can be tested and assessed. For the electrical test of mounted assemblies on a component level an in circuit test is possible, which complements the functional test around the aspect of the single component testing, for example, of free-wheeling diodes.
In Circuit Test (ICT)
In the test adaptor the ICT accesses the components using a bed of nails and measures either the electric parameters of resistors, capacitors and inductances or evaluates the digital output signals of the respective active electronic components via analog or digital input signals. Comparing with flying probe tests the use of a bed of nails is clearly faster due to the simultaneous access to many measuring points.